MIT 16.660J / ESD.62J / 16.853 Introduction to Lean Six Sigma Methods, IAP 2012 - Ses. 3-6: Six Sigma Basics

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This course includes

9 hours of video
Certificate of completion
Access on mobile and TV

Summary

Keywords

16-660j-introduction-to-lean-six-sigma-methods-january-iap-2012 capable process common cause variation control limits cp cpk customer quality lean lower control limit process capability process variation quality

Full Transcript

MIT 16.660J Introduction to Lean Six Sigma Methods, IAP 2012 View the complete course: http://ocw.mit.edu/16-660JIAP12 Instructor: Earll Murman This session introduces six sigma, a valuable approach for improving process quality. It includes an active learning exercise in which students learn how to interpret a basic statistical process control chart. License: Creative Commons BY-NC-SA More information at http://ocw.mit.edu/terms More courses at http://ocw.mit.edu

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