R and D Opportunities and the Future of RFID Frequencies
Peter Cole, University of Adelaide
Alan Levesque, WPI
Leena Ukkonen and Lauri Sydanheimo, Tampere University of Technology
Richard Fletcher, MIT
View the complete course at: http://ocw.mit.edu/ESD-290S05
License: Creative Commons BY-NC-SA
More information at http://ocw.mit.edu/terms
More courses at http://ocw.mit.edu
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